TY  - BOOK
TI  - Pattern recognition: 23rd DAGM symposium, Munich, Germany, September 12-14, 2001 : proceedings
AU  - Radig, Bernd. and Florczyk, Stefan.
editor = {Radig, Bernd.},
editor = {Florczyk, Stefan.},
A2  - Radig, Bernd.
A2  - Florczyk, Stefan.
CY  - Berlin ;
PB  - Springer
PY  - 2001
LA  - English
KW  - Pattern perception
KW  - Congresses.
KW  - Pattern perception
SN  - 3540425969 (pbk.) :
N1  - Includes index.
UR  - https://katalog.fid-bbi.de/Record/181-007756954
ER  -