TY  - BOOK
TI  - Pattern recognition
T3  - 
T3  - 12666
AU  - Del Bimbo, Alberto and Cucchiara, Rita and Sclaroff, Stan and Farinella, Giovanni Maria and Mei, Tao and Bertini, Marco
editor = {Del Bimbo, Alberto},
editor = {Cucchiara, Rita},
editor = {Sclaroff, Stan},
editor = {Farinella, Giovanni Maria},
editor = {Mei, Tao},
editor = {Bertini, Marco},
A2  - Del Bimbo, Alberto
A2  - Cucchiara, Rita
A2  - Sclaroff, Stan
A2  - Farinella, Giovanni Maria
A2  - Mei, Tao
A2  - Bertini, Marco
CY  - Cham
PB  - Springer
PY  - 2021
PY  - 2021
LA  - English
KW  - Konferenzschrift
KW  - Mustererkennung
KW  - Maschinelles Lernen
KW  - Musteranalyse
KW  - Forensik
KW  - (DE-627)
SN  - 9783030687793
N1  - Titelaufnahme entstanden auf Grundlage der Online-Ausgabe
UR  - https://www.gbv.de/dms/tib-ub-hannover/1752181034.pdf
UR  - https://katalog.fid-bbi.de/Record/183-1752181034
ER  -