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FGVRID Veranstaltung 2021 Online VerfasserIn (DE-588)1234066076 (DE-627)1758740248 aut, Pattern recognition Part 4 Alberto Del Bimbo, Rita Cucchiara, Stan Sclaroff, Giovanni Maria Farinella, Tao Mei, Marco Bertini [und zwei weitere], Cham Springer [2021], xix, 735 Seiten Diagramme, Text txt rdacontent, ohne Hilfsmittel zu benutzen n rdamedia, Band nc rdacarrier, Lecture notes in computer science 12664 SL6 - Image Processing, Computer Vision, Pattern Recognition, and Graphics, Titelaufnahme entstanden auf Grundlage der Online-Ausgabe, Konferenzschrift (DE-588)1071861417 (DE-627)826484824 (DE-576)433375485 gnd-content, s (DE-588)4040936-3 (DE-627)104360054 (DE-576)209042761 Mustererkennung gnd, s (DE-588)4193754-5 (DE-627)105224782 (DE-576)21008944X Maschinelles Lernen gnd, s (DE-588)4226567-8 (DE-627)10497060X (DE-576)210315199 Musteranalyse gnd, s (DE-588)1199322490 (DE-627)1681622963 (DE-576)210133341 Forensik gnd, (DE-627), Del Bimbo, Alberto HerausgeberIn (DE-588)115563164 (DE-627)551100141 (DE-576)289951119 edt, Cucchiara, Rita HerausgeberIn edt, Sclaroff, Stan HerausgeberIn edt, Farinella, Giovanni Maria HerausgeberIn edt, Mei, Tao HerausgeberIn edt, Bertini, Marco HerausgeberIn edt, HCAU 1. 2021 Online VerfasserIn (DE-588)1234066114 (DE-627)1758740302 aut, IADS 1. 2021 Online VerfasserIn (DE-588)1234066203 (DE-627)1758740426 aut, IML 1. 2021 Online VerfasserIn (DE-588)1234066262 (DE-627)1758740493 aut, International Conference on Pattern Recognition 25. 2021 Online VeranstalterIn (DE-588)1229006087 (DE-627)1750934906 orm, (DE-627)1752027957 Part 4 4 nnnm, 9783030687991 eBook, Lecture notes in computer science 12664 12664 (DE-627)129300152 (DE-576)014492687 (DE-600)121909-1 0302-9743 ns, https://www.gbv.de/dms/tib-ub-hannover/1758739126.pdf V:DE-601 B:DE-89 pdf/application Inhaltsverzeichnis |
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Pattern recognition, Lecture notes in computer science, 12664, Konferenzschrift, Mustererkennung, Maschinelles Lernen, Musteranalyse, Forensik |
title |
Pattern recognition |
title_auth |
Pattern recognition |
title_full |
Pattern recognition Part 4 Alberto Del Bimbo, Rita Cucchiara, Stan Sclaroff, Giovanni Maria Farinella, Tao Mei, Marco Bertini [und zwei weitere] |
title_fullStr |
Pattern recognition Part 4 Alberto Del Bimbo, Rita Cucchiara, Stan Sclaroff, Giovanni Maria Farinella, Tao Mei, Marco Bertini [und zwei weitere] |
title_full_unstemmed |
Pattern recognition Part 4 Alberto Del Bimbo, Rita Cucchiara, Stan Sclaroff, Giovanni Maria Farinella, Tao Mei, Marco Bertini [und zwei weitere] |
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Part 4 |
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Part 4 |
title_short |
Pattern recognition |
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pattern recognition |
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Pattern recognition |
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Konferenzschrift, Mustererkennung, Maschinelles Lernen, Musteranalyse, Forensik |
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Konferenzschrift, Mustererkennung, Maschinelles Lernen, Musteranalyse, Forensik |
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