3rd International Symposium on Knowledge Acquisition and Modeling (KAM), 2010 : 20 - 21 Oct. 2010, Wuhan, China

Titel: 3rd International Symposium on Knowledge Acquisition and Modeling (KAM), 2010 20 - 21 Oct. 2010, Wuhan, China
verantwortlich: Wu, Yanwen (Sonstige); Institute of Electrical and Electronics Engineers (Sonstige)
veröffentlicht: Piscataway, NJ: IEEE, 2010
Erscheinungsjahr: 2010
Medientyp: E-Book Konferenzbericht
Datenquelle: K10plus Verbundkatalog
Tags: Tag hinzufügen

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spelling	3rd International Symposium on Knowledge Acquisition and Modeling (KAM), 2010 20 - 21 Oct. 2010, Wuhan, China IEEE. Ed. by Yanwen Wu, Nebent. 2010 Third International Symposium on Knowledge Acquisition and Modeling proceedings, Piscataway, NJ IEEE 2010, Online-Ressource, Text txt rdacontent, Computermedien c rdamedia, Online-Ressource cr rdacarrier, Parallel als Druckausg. erschienen, Knowledge acquisition (Expert systems) Congresses, Konferenzschrift (DE-588)1071861417 (DE-627)826484824 (DE-576)433375485 gnd-content, Wu, Yanwen oth, Institute of Electrical and Electronics Engineers (DE-588)1692-5 (DE-627)100026842 (DE-576)190140712 oth, 9781424480050, 9781424480067, 9781424480074, http://ieeexplore.ieee.org/servlet/opac?punumber=5639673 application/pdf Verlag Volltext lizenzpflichtig Volltext
spellingShingle	3rd International Symposium on Knowledge Acquisition and Modeling (KAM), 2010: 20 - 21 Oct. 2010, Wuhan, China, Knowledge acquisition (Expert systems) Congresses, Konferenzschrift
title	3rd International Symposium on Knowledge Acquisition and Modeling (KAM), 2010: 20 - 21 Oct. 2010, Wuhan, China
title_alt	2010 Third International Symposium on Knowledge Acquisition and Modeling proceedings
title_auth	3rd International Symposium on Knowledge Acquisition and Modeling (KAM), 2010 20 - 21 Oct. 2010, Wuhan, China
title_full	3rd International Symposium on Knowledge Acquisition and Modeling (KAM), 2010 20 - 21 Oct. 2010, Wuhan, China IEEE. Ed. by Yanwen Wu
title_fullStr	3rd International Symposium on Knowledge Acquisition and Modeling (KAM), 2010 20 - 21 Oct. 2010, Wuhan, China IEEE. Ed. by Yanwen Wu
title_full_unstemmed	3rd International Symposium on Knowledge Acquisition and Modeling (KAM), 2010 20 - 21 Oct. 2010, Wuhan, China IEEE. Ed. by Yanwen Wu
title_short	3rd International Symposium on Knowledge Acquisition and Modeling (KAM), 2010
title_sort	3rd international symposium on knowledge acquisition and modeling (kam), 2010 20 - 21 oct. 2010, wuhan, china
title_sub	20 - 21 Oct. 2010, Wuhan, China
title_unstemmed	3rd International Symposium on Knowledge Acquisition and Modeling (KAM), 2010: 20 - 21 Oct. 2010, Wuhan, China
topic	Knowledge acquisition (Expert systems) Congresses, Konferenzschrift
topic_facet	Knowledge acquisition (Expert systems), Konferenzschrift
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3rd International Symposium on Knowledge Acquisition and Modeling (KAM), 2010 : 20 - 21 Oct. 2010, Wuhan, China

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